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* index scan  (Subject headings (XSP))P
 restrict (Basic classification (XBKL)) 53.15 (Elektrische Messtechnik und Prüftechnik)
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 1 
pantalla
 2 
paramagnetische elektronenresonanz
 2 
paramagnetische elektronenspinresonanz
 2 
partial discharge
 1 
particle size determination
 2 
partikelmesstechnik
 4 
pc
 2 
pc computer
 2 
pc ordinateur
 1 
perflektometer
 4 
performance measurement
 2 
performance-messung
 4 
periodical
 4 
periodicals
 4 
periodicals as topic
 4 
periodico
 8 
periodikum
 4 
périodique
 4 
périodiques
 1 
permeabilidad
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