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			1 - 10 von 88
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	1.	Fundamentals of Nanoscale Film Analysis Alford, Terry L.. - Boston, MA : Springer US, 2007

	2.	Physico-chemical phenomena in thin films and at solid surfaces Trachtenberg, Leonid Izrailevič. - 1. ed. - Amsterdam : Elsevier / Academic Press, 2007

	3.	Neutron reflectometry : a probe for materials surfaces ; proceedings of a technical meeting ; held in Vienna, 16 - 20 August 2004 Internationale Atomenergie-Organisation. - Vienna : International Atomic Energy Agency, 2006

	4.	Numerical data and functional ..., Group 3: Condensed matter, Vol. 42: Physics of covered solid ..., Subvol. A: Adsorbed layers on surfaces / Pt. 5, CD-ROM, Adsorption of molecules on metal, semiconductor and oxide surfaces Bonzel, Hans Paul. - 2006

	5.	Numerical data and functional ..., Group 3: Condensed matter, Vol. 42: Physics of covered solid ..., Subvol. A: Adsorbed layers on surfaces / Pt. 5, Adsorption of molecules on metal, semiconductor and oxide surfaces Christmann, Klaus. - 2006

	6.	Numerical data and functional ..., Group 3: Condensed matter, Vol. 42: Physics of covered solid ..., Subvol. A: Adsorbed layers on surfaces / Pt. 4, CD-ROM, Adsorbed species on surfaces and adsorbate-induced surface core level shifts Bonzel, Hans P.. - [Elektronische Ressource]. - 2005

	7.	Numerical data and functional ..., Group 3: Condensed matter, Vol. 42: Physics of covered solid ..., Subvol. A: Adsorbed layers on surfaces / Pt. 4, Adsorbed species on surfaces and adsorbate-induced surface core level shifts Bonzel, Hans P.. - 2005

	8.	Introduction to surface and superlattice excitations Cottam, Michael G. 1945-. - 2. ed. - Bristol [u.a.] : Institute of Physics Publ., c2005

	9.	Electron-beam interactions with solids : application of the Monte Carlo method to electron scattering problems Dapor, Maurizio 1959-. - Berlin : Springer, 2003

	10.	High resolution focused ion beams : FIB and its applications ; the physics of liquid metal ion sources and ion optics and their application to focused ion beam technology Orloff, Jon. - New York [u.a.] : Kluwer Academic/Plenum, c 2003

1 - 10 von 88

1 - 10 von 88